Physical Sciences › Engineering › Electrical and Electronic Engineering
Integrated Circuits and Semiconductor Failure Analysis
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Latest papers
- MAROON: A Dataset for the Joint Characterization of Near-Field High-Resolution Radio-Frequency and Optical Depth Imaging Techniques
Vanessa Wirth, Johanna Br\"aunig, Nikolai Hofmann, Martin Vossiek, Tim Weyrich, Marc Stamminger · 22 September 2026
Utilizing the complementary strengths of wavelength-specific range or depth sensors is crucial for robust computer-assisted tasks such as autonomous driving. Despite this, there is still little research done at the intersection of optical depth sensors and radars operating close range, where the tar…
- An Empirical Study of the Influence of Adversarial Fine-Tuning on Compressed Neural Networks
Hallgrimur Thorsteinsson, Valdemar J Henriksen, Daniel I R Cruz, Raghavendra Selvan, Tong Chen · 29 May 2026
As deep learning (DL) models are increasingly being integrated into our everyday lives, ensuring their safety by making them robust against adversarial attacks has become increasingly critical. DL models have been found to be susceptible to adversarial attacks by introducing small, targeted perturba…
- Adversarial Fine-tuning of Compressed Neural Networks for Joint Improvement of Robustness and Efficiency
Hallgrimur Thorsteinsson, Valdemar J Henriksen, Daniel I R Cruz, Raghavendra Selvan, Tong Chen · 28 May 2026
As deep learning (DL) models are increasingly being integrated into our everyday lives, ensuring their safety by making them robust against adversarial attacks has become increasingly critical. DL models have been found to be susceptible to adversarial attacks by introducing small, targeted perturba…
- Two failure modes of deep transformers and how to avoid them: a unified theory of signal propagation at initialisation
Alessio Giorlandino, Sebastian Goldt · 10 February 2026
Finding the right initialisation for neural networks is crucial to ensure smooth training and good performance. In transformers, the wrong initialisation can lead to one of two failure modes of self-attention layers: rank collapse, where all tokens collapse into similar representations, and entropy …
- On Fine-Grained I/O Complexity of Attention Backward Passes
Xiaoyu Li, Yingyu Liang, Zhenmei Shi, Zhao Song, Song Yue, Jiahao Zhang · 26 January 2026
Large Language Models (LLMs) exhibit exceptional proficiency in handling extensive context windows in natural language. Nevertheless, the quadratic scaling of attention computation relative to sequence length creates substantial efficiency bottlenecks, necessitating the development of I/O-optimized …
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