Semiconductor materials and devices

Últimos artículos

• SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits

  Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi · 7 de julio de 2026

  As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simu…

• Performance of AI agents based on reasoning language models on ALD process optimization tasks

  Angel Yanguas-Gil · 16 de enero de 2026

  In this work we explore the performance and behavior of reasoning large language models to autonomously optimize atomic layer deposition (ALD) processes. In the ALD process optimization task, an agent built on top of a reasoning LLM has to find optimal dose times for an ALD precursor and a coreactan…